Software Test Attacks to Break Mobile and Embedded Devices

Jon Duncan Hagar

September 25, 2013 by Chapman and Hall/CRC
Reference - 377 Pages - 80 B/W Illustrations
ISBN 9781466575301 - CAT# K16700
Series: Chapman & Hall/CRC Innovations in Software Engineering and Software Development Series

was $62.95

USD$50.36

SAVE ~$12.59

Add to Wish List
FREE Standard Shipping!

Features

  • Provides over 30 specific software test attacks needed to find bugs/errors in today’s mobile and smart devices
  • Explains how to create test labs, facilities, and tools to aid in conducting the attacks
  • Addresses white and black box test approaches as well as risk-based testing, model-driven tests, agile testing, and mathematical approaches
  • Details the error taxonomy upon which the attacks are based
  • Presents checklists for user interface and game evaluations
  • Includes practice exercises in each chapter

Watch a recent interview with author Jon Hagar.

Visit the author’s blog.

Summary

Address Errors before Users Find Them
Using a mix-and-match approach, Software Test Attacks to Break Mobile and Embedded Devices presents an attack basis for testing mobile and embedded systems. Designed for testers working in the ever-expanding world of "smart" devices driven by software, the book focuses on attack-based testing that can be used by individuals and teams. The numerous test attacks show you when a software product does not work (i.e., has bugs) and provide you with information about the software product under test.

The book guides you step by step starting with the basics. It explains patterns and techniques ranging from simple mind mapping to sophisticated test labs. For traditional testers moving into the mobile and embedded area, the book bridges the gap between IT and mobile/embedded system testing. It illustrates how to apply both traditional and new approaches. For those working with mobile/embedded systems without an extensive background in testing, the book brings together testing ideas, techniques, and solutions that are immediately applicable to testing smart and mobile devices.