Thin Films and Coatings: Toughening and Toughness Characterization

Sam Zhang

July 29, 2015 by CRC Press
Reference - 624 Pages - 16 Color & 455 B/W Illustrations
ISBN 9781482222906 - CAT# K22300
Series: Advances in Materials Science and Engineering

was $179.95

USD$143.96

SAVE ~$35.99

Add to Wish List
SAVE 25%
When you buy 2 or more print books!
See final price in shopping cart.
FREE Standard Shipping!

Features

  • Captures the latest developments in the toughening of hard coatings and in the measurement of the toughness of thin films and coatings
  • Contains chapters contributed by experts from Australia, China, Czech Republic, Poland, Singapore, Spain, and the United Kingdom
  • Provides novices and veterans alike with rich and timely information of great importance in today’s nanotechnology world

Summary

Thin Films and Coatings: Toughening and Toughness Characterization captures the latest developments in the toughening of hard coatings and in the measurement of the toughness of thin films and coatings. Featuring chapters contributed by experts from Australia, China, Czech Republic, Poland, Singapore, Spain, and the United Kingdom, this first-of-its-kind book:

  • Presents the current status of hard-yet-tough ceramic coatings
  • Reviews various toughness evaluation methods for films and hard coatings
  • Explores the toughness and toughening mechanisms of porous thin films and laser-treated surfaces
  • Examines adhesions of the film/substrate interface and the characterization of coating adhesion strength
  • Discusses nanoindentation determination of fracture toughness, resistance to cracking, and sliding contact fracture phenomena

Toughening and toughness measurement (of films and coatings) are two related, yet separate, fields of great importance in today’s nanotechnology world. Thin Films and Coatings: Toughening and Toughness Characterization is a timely reference written in such a way that novices will find it a stepping stone to the field and veterans will find it a rich source of information for their research.