Thermal-Aware Testing of Digital VLSI Circuits and Systems

1st Edition

Santanu Chattopadhyay

CRC Press
Published April 25, 2018
Reference - 118 Pages - 10 B/W Illustrations
ISBN 9780815378822 - CAT# K339019

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This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level

Describes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniques

This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips