Statistical Methods for SPC and TQM

1st Edition

D Bissell

Chapman and Hall/CRC
Published May 15, 1994
Reference - 384 Pages
ISBN 9780412394409 - CAT# C9440
Series: Chapman & Hall/CRC Texts in Statistical Science

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Summary

Statistical Methods for SPC and TQM sets out to fill the gap for those in statistical process control (SPC) and total quality management (TQM) who need a practical guide to the logical basis of data presentation, control charting, and capability indices.
Statistical theory is introduced in a practical context, usually by way of numerical examples. Several methods familiar to statisticians have been simplified to make them more accessible. Suitable tabulations of these functions are included; in several cases, effective and simple approximations are offered.

Contents
Data Collection and Graphical Summaries
Numerical Data Summaries-Location and Dispersion
Probability and Distribution
Sampling, Estimation, and Confidence
Sample Tests of Hypothesis; "Significance Tests"
Control Charts for Process Management and Improvement
Control Charts for Average and Variation
Control Charts for "Single-Valued" Observations
Control Charts for Attributes and Events
Control Charts: Problems and Special Cases
Cusum Methods
Process Capability-Attributes, Events, and Normally Distributed Data
Capability; Non-Normal Distributions
Evaluating the Precision of a Measurement System (Gauge Capability)
Getting More from Control Chart Data
SPC in "Non-Product" Applications
Appendices