Welcome to CRCPress.com! We have customized the Taylor & Francis India website to host CRC Press titles. Please choose www.TandFIndia.com to get the following benefits:
South Asia Editions of CRC Press titles with INR prices
Multiple options to purchase locally
All CRC Press products available
Your CRC Press login credentials will work on TandFIndia.com
Garland Science Website Announcement
The Garland Science website is no longer available to access and you have been automatically redirected to CRCPress.com.
All instructor resources (*see Exceptions) are now available on our Instructor Hub. Your GarlandScience.com instructor credentials will not grant access to the Hub, but existing and new users may request access here.
The student resources previously accessed via GarlandScience.com are no longer available to existing or new users.
This volume is devoted to the physics, instrumentation and analytical methods of secondary ion mass spectroscopy (SIMS) in relation to solid surfaces.
It describes modern models of secondary ion formation and the factors influencing sensitivity of measurements and the range of applications. All the main parts of SIMS instruments are discussed in detail. Emphasising practical applications the book also considers the methods and analytical procedures for constitutional analysis of solids --- including metals, semiconductors, organic and biological samples. Methods of depth profiling, spatially multidimensional analysis and study of processes at the surface, such as adsorption, catalysis and oxidation, are given along with the application of SIMS in combination with other methods of surface analysis.
Table of Contents
CHAPTER 1. PHYSICS OF SECONDARY ION EMISSION
Parameters of secondary ion emission
Effect of the primary ion energy and current on SIE
Effect of the target temperature on the SIE coefficient
Angular dependence of secondary ion emission
Secondary ion energy distribution
Effect of primary ions and target material on secondary ion yield
Effect of sample oxidation on SIE
Polyatomic ion emission
Mechanism of ionization of ejected atoms
CHAPTER 2. SIMS INSTRUMENTATION
Mass separation of primary beam
Primary and secondary ion optics
Ion detection and vacuum systems
CHAPTER 3. CONSTITUTIONAL ANALYSIS OF SOLIDS BY SIMS
Analytical characteristics of SIMS
Qualitative constitutional analysis
Physical background of quantitative analysis
Methods of quantitative analysis
Analysis of organic and biological samples
Standards and cross-calibration of instruments
CHAPTER 4. IN-DEPTH ANALYSIS
Technique of SIMS in-depth analysis
Study of thin films (vacuum condensates)
In-depth analysis of implantation profiles
Spatially multidimensional SIMS analysis
CHAPTER 5. STUDY OF PROCESSES AT THE SURFACE
Adsorption and catalysis
Investigation of metal oxidation
Comparison of SIMS with other methods of surface analysis
We provide complimentary e-inspection copies of primary textbooks to instructors considering our books for course adoption.
Most VitalSource eBooks are available in a reflowable EPUB format which allows you to resize text to suit you and enables other accessibility features. Where the content of the eBook requires a specific layout, or contains maths or other special characters, the eBook will be available in PDF (PBK) format, which cannot be reflowed. For both formats the functionality available will depend on how you access the ebook (via Bookshelf Online in your browser or via the Bookshelf app on your PC or mobile device).
CHOICE – Outstanding Academic Title – Award Winner
CHOICE – 2018 Outstanding Academic Title – Award Winner
Shingo Research and Professional Publication Award Winner
The country you have selected will result in the following:
Product pricing will be adjusted to match the corresponding currency.
The title will be removed from your cart because it is not available in this region.