Power, Thermal, Noise and Signal Integrity Issues on substrate/Interconnects entanglEment

1st Edition

Yue Ma, Christian Gontrand

CRC Press
February 19, 2019 Forthcoming
Reference - 248 Pages - 100 B/W Illustrations
ISBN 9780367023430 - CAT# K402609

For Instructors Request Inspection Copy

was $139.95

USD$111.96

SAVE ~$27.99

Add to Wish List
FREE Standard Shipping!

Summary

As demand for on-chip functionalities and requirements for low power operation continue to increase as a result of the emergence in mobile, wearable and internet-of-things (IoT) products, 3D/2.5D have been identified as an inevitable path moving forward. As circuits become more and more complex, especially three-dimensional ones, new insights have to be developed in many domains, including electrical, thermal, noise, interconnects, and parasites. It is the entanglement of such domains that begins the very key challenge as we enter in 3D nano-electronics. This book aims to develop this new paradigm, going to a synthesis beginning between many technical aspects.

Instructors

We provide complimentary e-inspection copies of primary textbooks to instructors considering our books for course adoption.

Request an
e-inspection copy

Share this Title