1st Edition

Particles on Surfaces Detection: Adhesion, and Removal

Edited By K.L. Mittal Copyright 1994

    This work comprises the proceedings of the Fourth Symposium on Particles on Surfaces. Papers cover: adhesion-induced deformations of particles on surfaces; the use of atomic force microscopy in probing particle-particle adhesion; particle contamination in microelectronics, on spacecraft, and on optical surfaces; the role of air ionization in reducing surface contamination by particles in the cleanroom; abrasive blasting media for contamination-free deburring processes; and more.;The book is intended for physical, chemical, surface and colloid chemists, materials scientists; polymers, plastics, electrical and electronics, computer, chemical and mechanical engineers; and upper-level undergraduate and graduate students in these disciplines.

    Preface

    Particles on Surface: Adhesion Induced Deformations

    D. S. Rimai, L. P. DeMejo, R. Bowen, and J. D. Morris

    Surface Force Tensile Interactions Between Micrometer Size Particles and a Polyester-PDMS Block Copolymer Substrate

    L. P. DeMejo, D. S. Rimai, J. H. Chen, and R. Bowen

    Polymer to Particle Adhesion Probed with Atomic Force Microscopy

    H. Mizes, K. –G. Loh, M. L. Ott, and R. J. D. Miller

    Surface Particle Contamination Identification in Microelectronics

    M. Simard-Nomandin

    An Overview of Spacecraft Particulate Contamination Phenomena

    M. C. Fong, A. L. Lee, and P. T. Ma

    Contamination on Optical Surfaces—Concerns, Prevention, Detection, and Removal

    J. M. Bennett

    An Advanced Surface Particle and Molecular Containment Identification, Removal, and Collection System

    S. P. Hotaling and D. A. Dykeman

    The Role of Air Ionization in Reducing Surface Contamination by Particles in the Cleanroom

    S. Gehlke and A. J. Steinman

    Selecting a Contamination-Free Deburring Process: Testing Abrasive Blasting Media

    W. L. Prater, G. J. Stone, and G. J. Chung

    Particle Generation and Control in Tubing and Piping Connection Design

    M. Alberg

    Detection and Identification of Particles on Silicon Surfaces

    T. Hattori

    The Characterization of Particles on Spacecraft Returned from Orbit

    E. R. Crutcher

    A Light-Scattering Method for Determining the Composition of Particles on Surfaces

    L. D. Lamb, J. D. Lorentzen, and D. R. Huffman

    Light Scattering by Spherical Particles on Planar Multi-Layered Substrates

    A. Cangellaris and F. I. Assi

    New Test Procedure for the Examination of the Particulate Cleanliness of Technical Surfaces

    H. –J. Warnecke and B. Klumpp

    Discrimination Between Particulate and Film Type Contamination on Surfaces by Means of Total Reflection X-Ray Fluorescence Spectrometry

    H. Schwenke and J. Knoth

    Particle Characterization on Surfaces by Auger Electron Spectroscopy

    W. F. Stickle, D. Paul, and L. A. LaVanier

    Interrogating the Behavior of Micrometer-Sized Particles on Surfaces with Focused Acoustic Waves

    G. J. Brereton and B. A. Bruno

    Removal of Glass Particles from Glass Surfaces: A Review

    A. Ghosh and W. P. Ryszytiwskyj

    Particle Removal Characteristics of Surface Cleaning Methods Involving Sonication and/or Spray Impingement

    R. Nagarajan

    Fluid Dynamics of Liquid Jets Used for Particle Removal from Surfaces

    R. Gim, T. Lesniewski, and S. Middleman

    Enhanced Particle Removal from Inertial Guidance Instrument Parts by Fluorocarbon Surfactant Solutions

    R. Kaiser

    Laser Cleaning Techniques for the Removal of Small Surface Particulates

    A. C. Tam, W. P. Leung, and W. Zapka

    Index

    Biography

    K.L.Mittal