1st Edition
Particles on Surfaces Detection: Adhesion, and Removal
This work comprises the proceedings of the Fourth Symposium on Particles on Surfaces. Papers cover: adhesion-induced deformations of particles on surfaces; the use of atomic force microscopy in probing particle-particle adhesion; particle contamination in microelectronics, on spacecraft, and on optical surfaces; the role of air ionization in reducing surface contamination by particles in the cleanroom; abrasive blasting media for contamination-free deburring processes; and more.;The book is intended for physical, chemical, surface and colloid chemists, materials scientists; polymers, plastics, electrical and electronics, computer, chemical and mechanical engineers; and upper-level undergraduate and graduate students in these disciplines.
Preface
Particles on Surface: Adhesion Induced Deformations
D. S. Rimai, L. P. DeMejo, R. Bowen, and J. D. Morris
Surface Force Tensile Interactions Between Micrometer Size Particles and a Polyester-PDMS Block Copolymer Substrate
L. P. DeMejo, D. S. Rimai, J. H. Chen, and R. Bowen
Polymer to Particle Adhesion Probed with Atomic Force Microscopy
H. Mizes, K. –G. Loh, M. L. Ott, and R. J. D. Miller
Surface Particle Contamination Identification in Microelectronics
M. Simard-Nomandin
An Overview of Spacecraft Particulate Contamination Phenomena
M. C. Fong, A. L. Lee, and P. T. Ma
Contamination on Optical Surfaces—Concerns, Prevention, Detection, and Removal
J. M. Bennett
An Advanced Surface Particle and Molecular Containment Identification, Removal, and Collection System
S. P. Hotaling and D. A. Dykeman
The Role of Air Ionization in Reducing Surface Contamination by Particles in the Cleanroom
S. Gehlke and A. J. Steinman
Selecting a Contamination-Free Deburring Process: Testing Abrasive Blasting Media
W. L. Prater, G. J. Stone, and G. J. Chung
Particle Generation and Control in Tubing and Piping Connection Design
M. Alberg
Detection and Identification of Particles on Silicon Surfaces
T. Hattori
The Characterization of Particles on Spacecraft Returned from Orbit
E. R. Crutcher
A Light-Scattering Method for Determining the Composition of Particles on Surfaces
L. D. Lamb, J. D. Lorentzen, and D. R. Huffman
Light Scattering by Spherical Particles on Planar Multi-Layered Substrates
A. Cangellaris and F. I. Assi
New Test Procedure for the Examination of the Particulate Cleanliness of Technical Surfaces
H. –J. Warnecke and B. Klumpp
Discrimination Between Particulate and Film Type Contamination on Surfaces by Means of Total Reflection X-Ray Fluorescence Spectrometry
H. Schwenke and J. Knoth
Particle Characterization on Surfaces by Auger Electron Spectroscopy
W. F. Stickle, D. Paul, and L. A. LaVanier
Interrogating the Behavior of Micrometer-Sized Particles on Surfaces with Focused Acoustic Waves
G. J. Brereton and B. A. Bruno
Removal of Glass Particles from Glass Surfaces: A Review
A. Ghosh and W. P. Ryszytiwskyj
Particle Removal Characteristics of Surface Cleaning Methods Involving Sonication and/or Spray Impingement
R. Nagarajan
Fluid Dynamics of Liquid Jets Used for Particle Removal from Surfaces
R. Gim, T. Lesniewski, and S. Middleman
Enhanced Particle Removal from Inertial Guidance Instrument Parts by Fluorocarbon Surfactant Solutions
R. Kaiser
Laser Cleaning Techniques for the Removal of Small Surface Particulates
A. C. Tam, W. P. Leung, and W. Zapka
Index
Biography
K.L.Mittal