Particle and Particle Systems Characterization: Small-Angle Scattering (SAS) Applications

Wilfried Gille

November 22, 2013 by CRC Press
Reference - 336 Pages - 164 B/W Illustrations
ISBN 9781466581777 - CAT# K18899

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  • Provides an overview of particle and particle systems characterization via SAS for two-phase particle ensembles
  • Introduces integral transformations, which (directly) include the order range as a free parameter and interrelate the scattering pattern with structure functions
  • Summarizes chord length distribution densities of selected geometric bodies and the first principles of their calculation
  • Discusses basic aspects of the connection between the particle volume fraction and particle-to-particle interference
  • Explains fundamental set models of stochastic geometry, the Boolean model, and the "Dead Leaves" model, as well as related structure functions and scattering patterns
  • Describes models for the analysis of the particle volume fraction incorporating results of stochastic geometry


Small-angle scattering (SAS) is the premier technique for the characterization of disordered nanoscale particle ensembles. SAS is produced by the particle as a whole and does not depend in any way on the internal crystal structure of the particle. Since the first applications of X-ray scattering in the 1930s, SAS has developed into a standard method in the field of materials science. SAS is a non-destructive method and can be directly applied for solid and liquid samples.

Particle and Particle Systems Characterization: Small-Angle Scattering (SAS) Applications is geared to any scientist who might want to apply SAS to study tightly packed particle ensembles using elements of stochastic geometry. After completing the book, the reader should be able to demonstrate detailed knowledge of the application of SAS for the characterization of physical and chemical materials.