2nd Edition
Optical Methods of Measurement Wholefield Techniques, Second Edition
Optical Methods of Measurement: Wholefield Techniques, Second Edition provides a comprehensive collection of wholefield optical measurement techniques for engineering applications. Along with the reorganization of contents, this edition includes a new chapter on optical interference, new material on nondiffracting and singular beams and their applications, and updated bibliography and additional reading sections.
The book explores the propagation of laser beams, metrological applications of phase-singular beams, various detectors such as CCD and CMOS devices, and recording materials. It also covers interference, diffraction, and digital fringe pattern measurement techniques, with special emphasis on phase measurement interferometry and algorithms. The remainder of the book focuses on theory, experimental arrangements, and applications of wholefield techniques. The author discusses digital hologram interferometry, digital speckle photography, digital speckle pattern interferometry, Talbot interferometry, and holophotoelasticity.
This updated book compiles the major wholefield methods of measurement in one volume. It provides a solid understanding of the techniques by describing the physics behind them. In addition, the examples given illustrate how the techniques solve measurement problems.
Waves and Beams
The Wave Equation
Plane Waves
Spherical Waves
Cylindrical Waves
Waves as Information Carriers
The Laser Beam
The Gaussian Beam
ABCD Matrix Applied to Gaussian Beams
Nondiffracting Beams—Bessel Beams
Singular Beams
Optical Interference
Introduction
Generation of Coherent Waves
Interference between Two Plane Monochromatic Waves
Multiple-Beam Interference
Interferometry
Diffraction
Fresnel Diffraction
Fraunhofer Diffraction
Action of a Lens
Image Formation and Fourier Transformation by a Lens
Optical Filtering
Optical Components in Optical Metrology
Resolving Power of Optical Systems
Phase-Evaluation Methods
Interference Equation
Fringe Skeletonization
Temporal Heterodyning
Phase-Sampling Evaluation: Quasi-Heterodyning
Phase-Shifting Method
Phase-Shifting with Unknown but Constant Phase-Step
Spatial Phase-Shifting
Methods of Phase-Shifting
Fourier Transform Method
Spatial Heterodyning
Detectors and Recording Materials
Detector Characteristics
Detectors
Image Detectors
Recording Materials
Holographic Interferometry
Introduction
Hologram Recording
Reconstruction
Choice of Angle of Reference Wave
Choice of Reference Wave Intensity
Types of Holograms
Diffraction Efficiency
Experimental Arrangement
Holographic Recording Materials
Holographic Interferometry (HI)
Fringe Formation and Measurement of Displacement Vector
Loading of the Object
Measurement of Very Small Vibration Amplitudes
Measurement of Large Vibration Amplitudes
Stroboscopic Illumination/Stroboscopic HI
Special Techniques in HI
Extending the Sensitivity of HI
Holographic Contouring/Shape Measurement
Holographic Photo-Elasticity
Digital Holography
Digital HI
Speckle Metrology
The Speckle Phenomenon
Average Speckle Size
Superposition of Speckle Patterns
Speckle Pattern and Object Surface Characteristics
Speckle Pattern and Surface Motion
Speckle Photography
Methods of Evaluation
Speckle Photography with Vibrating Objects: In-Plane Vibration
Sensitivity of Speckle Photography
Particle Image Velocimetry
White-Light Speckle Photography
Shear Speckle Photography
Speckle Interferometry
Correlation Coefficient in Speckle Interferometry
Out-of-Plane Speckle Interferometer
In-Plane Measurement: Duffy’s Method
Filtering Arrangements for Extracting Information from Specklegram
Out-of-Plane Displacement Measurement
Simultaneous Measurement of Out-of-Plane and In-Plane Displacement Components
Other Possibilities for Aperturing the Lens
Duffy’s Arrangement: Enhanced Sensitivity
Speckle Interferometry—Shape Measurement/Contouring
Speckle Shear Interferometry
Methods of Shearing
Theory of Speckle Shear Interferometry
Fringe Formation
Shear Interferometry without Influence of the In-Plane Component
Electronic Speckle Pattern Interferometry
Contouring in ESPI
Special Techniques
Spatial Phase-Shifting
Photo-Elasticity
Superposition of Two-Plane Polarized Waves
Linear Polarization
Circular Polarization
Production of Polarized Light
Malus’s Law
The Stress–Optic Law
The Strain–Optic Law
Methods of Analysis
Evaluation Procedure
Measurement of Fractional Fringe Order
Phase-Shifting
Birefringent Coating Method: Reflection Polariscope
Holo-Photo-Elasticity
Three-Dimensional Photo-Elasticity
Examination of the Stressed Model in Scattered Light
The Moiré Phenomenon
Introduction
The Moiré Fringe Pattern between Two Linear Gratings
The Moiré Fringe Pattern between a Linear Grating and a Circular Grating
Moiré between Sinusoidal Gratings
Moiré between Reference and Deformed Gratings
Moiré Pattern with Deformed Sinusoidal Grating
Contrast Improvement of the Additive Moiré Pattern
Moiré Phenomenon for Measurement
Measurement of In-Plane Displacement
Measurement of Out-of-Plane Component and Contouring
Slope Determination for Dynamic Events
Curvature Determination for Dynamic Events
Surface Topography with Reflection Moiré Method
Talbot Phenomenon
Index
Bibliography and Additional Reading appear at the end of each chapter.
Biography
Rajpal S. Sirohi is currently the vice chancellor of Amity University. Prior to this, he was the vice chancellor of Barkatullah University and director of the Indian Institute of Technology Delhi. The recipient of many international awards and author of more than 400 papers, Dr. Sirohi is involved with research concerning optical metrology, optical instrumentation, holography, and speckle phenomenon.
