The concepts in this book will provide a comprehensive overview of the current state for a broad range of nitride semiconductor devices, as well as a detailed introduction to selected materials and processing issues of general relevance for these applications. This compilation is very timely given the level of interest and the current stage of research in nitride semiconductor materials and device applications. This volume consists of chapters written by a number of leading researchers in nitride materials and device technology addressing Ohmic and Schottky contacts, AIGalnN multiple quantum well laser diodes, nitride vertical cavity emitting lasers, and ultraviolet photodetectors. This unique volume provides a comprehensive review and introduction to application and devices based on GaN and related compounds for newcomers to the field and stimulus to further advances for experienced researchers.
List of Symbols
1. Shock Analysis
2. Shock Response Spectra Domains
3. Characteristics of Shock Response Spectra
4. Development of Shock Test Specifications
5. Kinematics of Simple Shocks
6. Standard Shock Machines
7. Generation of Shcok using Shakers
8. Simulation of Pyroshocks
9. Control of a Shaker using a Shock Response Spectrum
Appendix. Similitude in Mechanics
Mechanical Shock Test: A Brief Historical Background
Bibliography
Index
Synopsis of Five Volume Series
Biography
Christian Lalanne is an expert at the French Atomic Energy Authority, who has specialized in the study of vibration and shock for more than 30 years. The author of numerous publications in the field, he has been associated with new methods of drafting testing specifications and associated informatic tools.
