Edited
By Y Arakawa, Y. Hirayama, K Kishino, H Yamaguchi
September 30, 2002
An international perspective on recent research, Compound Semiconductors 2001 provides an overview of important developments in III-V compound semiconductors, such as GaAs, InP, and GaN; II-VI compounds, such as ZnSe and CdTe; and IV-IV compounds, such as SiC and SiGe. The book contains 139 papers ...
Edited
By M. Aindow, C. J. Kiely
December 01, 2001
Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Electron Microscopy and Analysis 2001 presents a useful snapshot of the latest developments in instrumentation, analysis techniques, and applications of electron and ...
By Donald E Simanek, John. Holden
October 01, 2001
Copiously illustrated throughout with many fine drawings by John C. Holden, Science Askew: A Light-Hearted Look at the Scientific World is a refreshing antidote to the daily grind. From continental drip to the life of Konrad Finagle via the murky depths of Loch Ness, we are treated to an off-kilter...
Edited
By K Ploog, Gunter Weimann
January 01, 2000
An international perspective on the latest research, Compound Semiconductors 1999 presents an overview of important developments in all III-V compound semiconductors such as GaAs, InP, and GaN; II-VI compounds such as ZnS, ZnSe, and CdTe; IV-IV compounds such as SiC and SiGe; and IV-VI compounds ...
Edited
By D Williams, R Shimizu
January 01, 2000
Microbeam Analysis provides a major forum for the discussion of the latest microanalysis techniques using electron, ion, and photon beams. The volume contains 250 papers from the leading researchers in this advancing field. Researchers in physics, materials science, and electrical and electronic ...
Edited
By A.G Cullis, R Beanland
January 01, 2000
With IC technology continuing to advance, the analysis of very small structures remains critically important. Microscopy of Semiconducting Materials provides an overview of advances in semiconductor studies using microscopy. The book explores the use of transmission and scanning electron microscopy...
Edited
By H Sakaki, J.C. Woo, N Yokoyama, Y Harayama
January 01, 1999
Compound Semiconductors 1998 explores research and development in key semiconductor materials and III-V compounds such as gallium arsenide, indium phosphide, gallium nitride, silicon germanium, and silicon carbide. It critically assesses progress in key technologies such as reliability assessment ...
By J. Doneker, I. Rechenberg
January 01, 1998
Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This volume addresses advances in defect analyzing techniques and ...
Edited
By R.D Tomlinson, A.E Hill, R.D Pilkington
January 01, 1998
Multinary compounds are now used in a wide range of devices, including photovoltaic solar cells, light emitters and detectors, and piezoelectric actuators. Ternary and Multinary Compounds provides an interdisciplinary forum for scientists and engineers working on fundamental and applied aspects of ...
Edited
By Sune Svanberg, C.G Wahlstrom
January 01, 1996
X-Ray Lasers 1996 provides not only an overview and progress report on this fast moving field, but also important reference material on which future work can be built. Topics covered include collisional x-ray lasers, table-top x-ray lasers, beam optics, x-ray optics, OFI and photo-pumped schemes, ...
Edited
By J.L Reno
January 01, 1995
Narrow Gap Semiconductors 1995 contains the invited and contributed papers presented at the Seventh International Conference on Narrow Gap Semiconductors, held in January 1995. The invited review papers provide an overview and the contributed papers provide in-depth coverage of research results ...