Electron Microscopy and Analysis 2001

1st Edition

M. Aindow, C. J. Kiely

CRC Press
Published December 1, 2001
Reference - 529 Pages
ISBN 9780750308120 - CAT# IP245
Series: Institute of Physics Conference Series

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Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Electron Microscopy and Analysis 2001 presents a useful snapshot of the latest developments in instrumentation, analysis techniques, and applications of electron and scanning probe microscopies. The book is ideal for materials scientists, solid state physicists and chemists, and researchers in these areas who want to keep abreast of the state of the art in the field.