Welcome to CRCPress.com! We have customized the Taylor & Francis India website to host CRC Press titles. Please choose www.TandFIndia.com to get the following benefits:
South Asia Editions of CRC Press titles with INR prices
Multiple options to purchase locally
All CRC Press products available
Your CRC Press login credentials will work on TandFIndia.com
Garland Science Website Announcement
The Garland Science website is no longer available to access and you have been automatically redirected to CRCPress.com.
All instructor resources (*see Exceptions) are now available on our Instructor Hub. Your GarlandScience.com instructor credentials will not grant access to the Hub, but existing and new users may request access here.
The student resources previously accessed via GarlandScience.com are no longer available to existing or new users.
Electron Microscopy and Analysis 1997 celebrates the centenary anniversary of the discovery of the electron by J.J. Thomson in Cambridge and the fiftieth anniversary of this distinguished Institute group. The book includes papers on the early history of electron microscopy (from P. Hawkes), the development of the scanning electron microscope at Cambridge (from K. Smith), electron energy loss spectroscopy (from L.M. Brown), imaging methods (from J. Spence), and the future of electron microscopy (from C. Humphreys). Covering a wide range of applications of advanced techniques, it discusses electron imaging, electron energy-loss and x-ray analysis, and scanning probe and electron beam microscopies. This volume is a handy reference for professionals using microscopes in all areas of physics, materials science, metallurgy, and surface science to gain an overview of developments in our understanding of materials microstructure and of advances in microscope interrogation techniques.
Table of Contents
Plenary lectures (5 papers). New instrumentation and electron optics (15 papers). High resolution electron microscopy (8 papers). Electron crystallography (5 papers). Electron energy-loss spectroscopy (11 papers). Advanced scanning probe techniques (6 papers). Advanced scanning electron microsocpy and surface science (11 papers). Microanalysis (27 papers). Catalysts (7 papers). Semiconductors and superconductors (12 papers). Ceramics and interfaces (19 papers). Intermetallics (11 papers). General materials analysis (23 papers). Index.
Abstracted in INSPEC Database. ted in INSPEC Database.
We provide complimentary e-inspection copies of primary textbooks to instructors considering our books for course adoption.
Most VitalSource eBooks are available in a reflowable EPUB format which allows you to resize text to suit you and enables other accessibility features. Where the content of the eBook requires a specific layout, or contains maths or other special characters, the eBook will be available in PDF (PBK) format, which cannot be reflowed. For both formats the functionality available will depend on how you access the ebook (via Bookshelf Online in your browser or via the Bookshelf app on your PC or mobile device).
CHOICE – Outstanding Academic Title – Award Winner
CHOICE – 2018 Outstanding Academic Title – Award Winner
Shingo Research and Professional Publication Award Winner
The country you have selected will result in the following:
Product pricing will be adjusted to match the corresponding currency.
The title will be removed from your cart because it is not available in this region.