Atomic Force Microscopy in Nanobiology

1st Edition

Kunio Takeyasu

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Pan Stanford
Published April 19, 2016
Reference - 458 Pages
ISBN 9780429074219 - CAT# KE75745

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Summary

Recent developments in atomic force microscopy (AFM) have been accomplished through various technical and instrumental innovations, including high-resolution and recognition imaging technology under physiological conditions, fast-scanning AFM, and general methods for cantilever modification and force measurement. All these techniques are now highly