Advanced VLSI Design and Testability Issues

1st Edition

Suman Lata Tripathi, Sobhit Saxena, Sushanta Kumar Mohapatra

CRC Press
August 19, 2020 Forthcoming
Reference - 352 Pages - 192 B/W Illustrations
ISBN 9780367492823 - CAT# 362380

For Instructors Request Inspection Copy

was $110.00


SAVE ~$22.00

Available for pre-order. Item will ship after August 19, 2020
Add to Wish List
FREE Standard Shipping!


This book facilitates the VLSI interested people not only with the in-depth knowledge but the broad aspects of it by explaining its applications in different fields e.g. image processing and biomedical. The deep understanding of basic concepts gives you the power to develop a new application aspect, which is very well taken care of in this book by using simple language in explaining the concepts. In the VLSI world, the importance of hardware description languages cannot be ignored as the designing of such dense and complex circuits is not possible without them. Both Verilog and VHDL languages are used here for designing. The current needs of high performance integrated circuits including low power devices and new emerging materials which can play a very important role in achieving new functionalities, are the most interesting part of the book. The testing of VLSI circuits becomes more crucial than the designing of the circuits in this nanometer technology era. The role of fault simulation algorithms is very well explained and its implementation using Verilog is the key aspect of this book.

This book is well organized in 20 chapters. Chapter 1 emphasizes on uses of FPGA on various image processing and biomedical applications. Then the descriptions enlighten the basic understanding of digital design from the perspective of HDL in Chapters 2 to 5. The performance enhancement with alternate material or geometry for silicon-based FET designs are focused in chapter 6 and 7. Chapter 8 and 9 describes the study of bimolecular interactions with Bio-sensing FETs. Chapter 10 to 13 deals with advanced FET structures available in various shapes, materials such as nanowire, HFET etc. and their comparison in terms of device performance metrics calculation. Chapter 14 to 18 describes different application-specific VLSI design techniques and challenges for analog and digital circuit design. Chapter 19 explains the VLSI testability issues with the description of simulation and its categorization into logic and fault simulation for test pattern generation using Verilog HDL. Chapter 20 deals with a secured VLSI design with hardware obfuscation by hiding the IC’s structure and function which makes it much more difficult to reverse engineer by the adversaries.


We provide complimentary e-inspection copies of primary textbooks to instructors considering our books for course adoption.

Request an
e-inspection copy

Share this Title