Electron Microscopy and Analysis 2003

Electron Microscopy and Analysis 2003: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, 3-5 September 2003

Series:
Published:
Content:
Editor(s):
Free Standard Shipping

Purchasing Options

Hardback
$262.00 $209.60
ISBN 9780750309677
Cat# IP246
Add to cart
SAVE 20%
 

Summary

Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Containing the proceedings from the Electron Microscopy and Analysis Group (EMAG) conference in September 2003, this volume covers current developments in the field, primarily in the UK. These conferences are biennial events organized by the EMAG of the Institute of Physics to provide a forum for discussion of the latest developments in instrumentation, techniques, and applications of electron and scanning probe microscopies.

Table of Contents

Plenary Lectures
Functional Materials and Biomaterials
New Instrumentation
Imaging Theory
Theory of Microscopy and Spectroscopy
Structural Materials
Advances in Nanoanalysis
Advances in Imaging
Sample Preparation and Nanofabrication
Surfaces and Interfaces
Nanomaterials

Author Index
Subject Index

 
Textbooks
Other CRC Press Sites
Featured Authors
STAY CONNECTED
Facebook Page for CRC Press Twitter Page for CRC Press You Tube Channel for CRC Press LinkedIn Page for CRC Press Google Plus Page for CRC Press Pinterest Page for CRC Press
Sign Up for Email Alerts
© 2014 Taylor & Francis Group, LLC. All Rights Reserved. Privacy Policy | Cookie Use | Shipping Policy | Contact Us